Oldham, Timothy R   <br/><br/>
Lonizing radiation effects in mos oxides  
/ Timothy R Oldham 
.- Singapore : World Scientific , 1999 
.- xiv, 171 p. :; 23cm 
.- International advances in solid state electronics and technology .
<br/><br/><label>Tóm tắt: This volume is intended to serve as an updated critical guide to the extensive literature on the basic physical mechanisms controlling the radiation and reliability responses of MOS oxides. 
<br/><br/><label>ISBN: 9810233264 
<br/><br/><label>Từ khóa - Ngành đào tạo: Cơ bản 
<br/><br/><label>Ký hiệu xếp giá: 539.72  / O375